New Atomic Force Microscopy arrived!

Our new Park FX40 Atomic Force Microscopy (AFM) has been set up! The equipment is a powerful tool of studying nanoscale phenomenon of materials, which is featured with automatic probe installation, laser and PSD alignment, along with multifunctional capabilities such as atmosphere control, solid/liquid phase imaging, cooling/heating, nanomechanics, electrostatic force microscopy, magnetitic force microscopy with field generator, Kelvin probe force microscopy (KPFM), conductive-AFM (C-AFM), scanning thermal microscopy (SThM), etc.

More reading about the equipment: https://parksystems.com/products/small-sample-afm/park-fx40